1) TEM in situ observation
透射电镜原位观察
4) in situ TEM tension
透射电镜原位拉伸
5) SEM
电镜观察
1.
SEM of Common Cultivated Juncus effusus L.var. decipiens Buchen in Jiangsu and Zhejiang Provinces;
江浙地区席草品种结构的扫描电镜观察
2.
Objective Using scanning electron microscopy(SEM) to observe smear layers after caries removal by three methods:traditional dental turbine,air abrasion,CarisolvTM chemo-mechanical caries removal.
目的应用扫描电镜观察传统高速牙钻法、空气喷砂法、CarisolvTM化学机械法去龋后牙本质表面玷污层,肉眼观察窝洞洞底表面。
6) electron microscopic observation
电镜观察
1.
Scanning electron microscopic observation on leaves surface structure of Dendrobium under untrition stress;
养分胁迫条件下石斛兰叶片表面结构的电镜观察
补充资料：EM208型矿物微束分析透射电镜
EM208型矿物微束分析透射电镜
呱EM208·····…… ..鞘麟翼:
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条