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1)  X-ray diffraction increment method
X射线衍射增量法
1.
The paper has briefly described the basic principle of X-ray diffraction increment method, experiment process and conditions and successfully applied the method in quantitative analysis on gibbsite in red soil from accumulated type bauxite in Western Guangxi.
简述了 X射线衍射增量法进行定量分析的原理、实验过程和实验条件 ,并用该方法对桂西堆积型铝土矿中的红土三水铝石进行了定量分析。
2)  method for XRD
X线衍射法
1.
Study on the determination in micro-amounts of free SiO _2 in respirable dust in the air of workplace by a method for XRD;
方法 采用X线衍射法。
3)  X-ray diffraction method
X射线衍射法
1.
The crystallinity of polypropylene was measured by X-ray diffraction method.
用X射线衍射法测定了注射成型聚丙烯的结晶度,并用偏光显微镜法观察了它的结晶形态。
4)  X-ray diffractometry
X射线衍射法
1.
Ternary sublattice site occupancy in three Ll_2-structured TiAl_3 based intermetallic compounds were e-valuated by X-ray diffractometry.
采用X射线衍射法测定了Ll_2结构TiAl_3基有序金属间相中合金原子的位置。
5)  X-ray diffraction
X射线衍射法
1.
X-ray diffraction method of measuring microball coat thickness
测量微球覆层厚度的X射线衍射法
2.
In the mean time it is measured by X-ray diffraction.
应用理论公式和ANSYS有限元分析软件对典型结构的应力分布进行了计算,同时应用X射线衍射法对该结构的应力进行了测试。
3.
The X-ray diffraction is chosen as the tool of residual stress measurement in CAS glass ceramics after comparison of several common measuring procedures .
分析了CAS系统微晶玻璃中热残余应力的形成机理,并对几种常见的残余应力的方法进行了比较,最后确定用普通X射线衍射法测定CAS系统微晶玻璃中的残余应力。
6)  X-Ray [英]['eks reɪ]  [美]['ɛks 're]
X-射线衍射法
1.
The principles of Differential Scanning Calorimetry, Electron Microscope,Nuclear Magnetic Resonance and X-Ray were introduced in this paper together with their applications in oil quality control, Development direction of investigation on oil quality control was also forecasted here.
介绍了现代物理化学方法(差示扫描量热法、电子显微镜、核磁共振法、X-射线衍射法)的原理及其在油脂质量控制中的应用,并预测了油脂质量控制研究的发展方向。
2.
Methods IR、X-ray、 ~(1)H-nuclear magnetic resonance(~(1)H-NMR) experiments were utilized to study the inclusion complex of DS-β-CD and its possible forms.
方法用红外光谱法、X-射线衍射法、1H磁共振(1H-NMR)等方法,确认β-CD与双氯酚酸钠包合及其包合的可能形式。
补充资料:X射线荧光增量法
分子式:
CAS号:

性质:又称标准(溶液)加入法。X射线荧光分析试样中待测元素含量低于5%~10%时所用的一种定方法。其方法与原子发射光谱增量法操作相同,仅所加入待测元素的含量应比试样含量增大1至3倍。以加入量为横坐标,荧光强度为纵坐标绘制校准曲线。

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