1.
Study of Key Techniques of Microscopic Interferometry in Mini-surface Geometry;
显微干涉术在测量微小表面几何参数中的关键技术研究
2.
Study on the Dynamic Testing Methods and System of MEMS Based on Microscopic Interferometry
基于显微干涉术的微机电系统动态测试方法与系统的研究
3.
Study on Out-of Plane Motion in MEMS Using Phase-stepping Microscopic Interferometry and Stroboscopic Imaging Technique;
利用相移显微干涉术和频闪成像技术研究MEMS离面运动
4.
differential interference contrast microscopy
差示干涉差显微镜术
5.
differential interference phasecontrast microscope
微差干涉衬比显微镜
6.
differential interference contrast microscope
微分干涉相差显微镜
7.
Measuring Dynamic Characterization of Micro-structures with Linnik Microscopic Interferometry
利用Linnik显微干涉技术测量微结构动态特性
8.
Linnik Microscopic Interferometry for Measuring the Surface Profile of Microstructures Through Transparent Media
透明介质下微结构表面形貌的Linnik显微干涉测量技术
9.
A Testing System for Optical Fiber Connector End Surface Based on Microscopic Interferometry
光纤连接器端面的显微干涉测试系统
10.
Small-angle Measurement Based on Laser Self-mixing Interferometry;
基于激光自混合干涉的微角度测量技术
11.
Reconstruction of the 3D Surface Profile of Micro Device Based on White-Light Interference Measurement Technology
基于白光干涉测量技术的微器件三维形貌重构
12.
Test method for stacking fault density of epitaxial layers of silicon by interference-contrast microscopy
GB/T14145-1993硅外延层堆垛层错密度测定干涉相衬显微镜法
13.
Measuring Method for Topography of DOE Based on Dual-Path Two-Wavelength Phase Shifting Interferometric Microscopy
双光路双波长相移干涉显微法测量衍射光学元件形貌
14.
The Study on Heterodyne Interferometric Microscope for Profiles of Microelectronic Mask Surfaces Measurement;
用于掩模板表面形貌测量的外差干涉显微系统的研究
15.
Study on Key Issues Improving the Performance of Fiber-Optic Interferometric Sensors Detecting Weak Magnetic Field
改善干涉型光纤微弱磁场传感器性能的若干关键技术研究
16.
solar microwave interferometer imaging system
太阳微波干涉成像系统
17.
Micromachined Optical Readable Uncooled Thermal Imaging Technology Based on Fabry-Perot Interferential Principle;
微机械法布里-泊罗干涉型光学读出非致冷热成像技术研究
18.
Research on the Measurement of 3-D Surface Topography Based on Phase-Stepping Interferometer;
基于相移干涉法的三维表面微观轮廓测量技术的研究