1.
Research on Low-Power Test in VLSI Scan Test;
VLSI扫描测试中的低功耗测试方法研究
2.
Low Power Testing Way for RAM of the MCU System
一种单片机系统RAM的低功耗测试方法
3.
Research on Circuit Fault Diagnosis and Low-Power Test;
电路故障诊断可测性设计及低功耗测试研究
4.
Two-Stage Scan Architecture for Low Power Path Delay Fault Scan Testing;
基于两级扫描结构路径延迟故障的低功耗测试
5.
Research and Implementation of Low-power Test Structure Based on Segment Transformation;
基于片段间转移的低功耗测试结构研究与实现
6.
Development of a Lower Power Consumption Dielectric Loss Angle Tester Based on DSP
基于DSP的低功耗介质损耗测试仪的研制
7.
DCScan: A Power-Aware Scan Testing Architecture
DCScan：一种低功耗的扫描测试结构
8.
Research on novel low test power based on two threshold VLSI
双阈值VLSI低测试功耗方法研究
9.
Low Power Consumption Design and Test for Handheld RFID Reader
手持式RFID读写器的低功耗设计与测试
10.
The Research on NoC Test Scheduling and Mapping Method Concerning Low-Power
面向低功耗的NoC测试调度与映射方法研究
11.
The Research on Low-Power and Data Compression Techniques in SoC Test
SoC测试中的低功耗与数据压缩方法研究
12.
An Effective Method for Depressing Scan-based Test Power
一种有效降低扫描结构测试功耗的方法
13.
Design,package and test of ultra high-speed low power 4:1 multiplexer
超高速低功耗4:1复接器设计、封装及测试
14.
Improve Test Compression Ratio and Reduce Test Power of EFDR Codes by Scan Chain Reconfiguration
用扫描链重构来提高EFDR编码的测试压缩率和降低测试功耗
15.
The Research on Low-energy Test for SoC and BIST Which Based on the State Seeds;
低功耗SoC测试技术及基于状态种子的BIST策略研究
16.
Testing Time and Testing Power For a SOC Co-optimization
SOC测试时间与测试功耗协同优化
17.
Power Consumption and Factor Test
消耗功率及功率因素测试
18.
Low Power MP3 Decoder and Its Design-for-Testability Techniques;
低功耗MP3解码器设计及其可测性分析