说明:双击或选中下面任意单词,将显示该词的音标、读音、翻译等;选中中文或多个词,将显示翻译。
您的位置:首页 -> 句库 -> 亚微米MOS器件
1.
The Study on the Hot-Carrier Effect in Deep Sub-Micron MOSFET;
亚微米MOS器件热载流子效应研究
2.
A Research on RTS Noise in Ultra Deep Submicron MOS Devices;
超深亚微米MOS器件RTS噪声研究
3.
Study on the Structure and Reliability of Deep Submicrion SDE MOSFET;
深亚微米SDE MOS器件结构及可靠性研究
4.
Direct Tunneling Processes in Nano-Metal-Oxide Semiconductor Devices;
纳米MOS器件中直接隧穿过程的研究
5.
Simulation of Quantum Transport Effects in Nano-scaled Double-Gate MOSFETs;
纳米双栅MOS器件量子输运效应的模拟研究
6.
Analysis and Simulation of Quantum Mechanical Effects in Nano-scale MOSFETs;
纳米MOS器件中的量子效应分析及其模拟
7.
The Submicron GaAs PHEMT Device and its Small Signal Modeling;
亚微米GaAs PHEMT器件及其小信号建模
8.
Research on NBTI in Ultra Deep Sub Micron PMOSFET Device;
超深亚微米PMOSFET器件NBTI研究
9.
Research on Hot-carrier Effects for Deep-submicron LDD MOSFET
深亚微米LDD MOSFET器件热载流子效应研究
10.
Study and Fabrication of SOI/SiGe MOS Device;
SOI/SiGe MOS器件研究和制备
11.
Study on AlGaN/GaN MOS-HEMT's Characteristics
AlGaN/GaN MOS-HEMT器件特性研究
12.
Application of Non-equilibrium Green s Function in Nano-MOS Device Analysis;
非平衡格林函数法在纳米量级MOS器件分析中的应用
13.
Design and Performance Study for AlN as the Gate Dielectric Material Applied to Nano-scale MOS Devices
应用于纳米级MOS器件的AlN栅介质材料设计及性能研究
14.
Study on Hot-carrier Effect in Ultra-deep Submicronmeter MOSFET;
超深亚微米MOSFET器件中热载流子效应的研究
15.
Study of the GIDL Current and Related Reliability Issues for Ultra-deep Submicron CMOS Devices;
超深亚微米CMOS器件GIDL电流及其可靠性研究
16.
FOD Based ESD Protection Devices in Deep Sub-micron Technology
深亚微米工艺中场氧器件静电防护能力的研究
17.
Study on Materials and Processes of Strained Si MOSFETs;
应变硅MOS器件的材料和工艺研究
18.
Research on The Breakdown Voltage of SOI High Voltage MOS Devices;
SOI高压MOS器件击穿特性研究