1.
Expansion of Communication Interface for Diode Test Machine based on Data Acquisition
基于数据采集的二极管测试机通信接口扩展
2.
TI ? The maximum voltage developed across an input diode with test current applied.
测试电流加到输入二极管所产生的最大压降。
3.
Research on the Characteristics Measurement of Light Emitting Diodes and Laser Diodes;
发光二极管及半导体激光器特性参数测试研究
4.
Life Test and Reliability of GaN Based Light Emitting Diodes;
GaN基发光二极管的寿命测试与可靠性分析
5.
Analysis and Research of Measuring Minority-Carrier Lifetime in Diode and Silicon Material of Bonding;
硅键合材料及二极管少子寿命测试分析与研究
6.
Research on an Intelligent Control Instrument for the Test and Sort of Semiconductor Diodes;
智能型二极管理测试分选控制仪的研究
7.
Fabrication and Characteristics Test of ITO/CuPc/Alq_3/Al Organic Light-emitting Diodes
ITO/CuPc/Alq_3/Al有机发光二极管的制备与特性测试
8.
Discussing the Calibration Method of the Light-emitting Diode-based Surface Resistance Tester
浅谈发光二极管型表面电阻测试仪校准方法
9.
And the field emission characteristic of the CNT-trunk was test by a simple diode structure.
而所成长的奈米碳管以简单的二极量测来测试其场发射特性。
10.
Processing、Characteristic Testing and the Optimization Design of Optical Coatings for 1.3um Superluminescent Diode;
1.3um超辐射发光二极管的工艺、性能测试与光学膜的优化设计
11.
Low-frequency Noise Measurement System Design and Reliability Screening Methods Study of Reference Diodes
基准二极管低频噪声测试系统设计及其可靠性筛选方法研究
12.
This paper introduces a new method to measure the intensity distribution of single seam diffraction by replacing the silicon photocell and light activated diode with light activated triode.
利用光敏三极管代替硅光电池和光敏二极管来测试单缝和双缝衍射的光强分布。
13.
diode other than photosensitive or light emitting diodes
二极管,光敏二极管或发光二极管除外
14.
silicon photodiode vacuum ultraviolet detector
硅光电二极管真空紫外探测器
15.
silicon-avalanche photodiode detector
硅雪崩光电二极管检测器
16.
High temperature instruments use photodiodes.
高温测量仪器用光电二极管。
17.
Oscillograph Measurement Methods of Dynamic Resistance of Diode with Steady Pressure;
稳压二极管动态电阻的示波器测量法
18.
A Handy Way of Determination the Exact V-A of Diode;
准确测量二极管伏安特性的简便方法