1.
Acceptance and reliability for discrete semiconductor devices
GB/T4938-1985半导体分立器件接收和可靠性
2.
The Research and Development of Semiconductor Testing System Based on S3C44B0;
基于S3C44B0的半导体分立器件测试系统的开发
3.
Semiconductor discrete devices and integrated circuits--Part 7: Bipolar transistors
GB/T4587-1994半导体分立器件和集成电路第7部分:双极型晶体管
4.
The Development of Discrete Semiconductor Testing System with CPLD Simulated System Bus;
基于CPLD模拟系统总线的半导体分立器件测试系统开发
5.
The Research and Development of Semiconductor Testing Equipment Based on Embedded Technology;
基于嵌入式技术的半导体分立器件测试系统的开发
6.
Semiconductor devices-Sectional specification for discrete devices
GB/T12560-1990半导体器件分立器件分规范(可供认证用)
7.
Semiconductor devices--Discrete devices and integrated circuits--Part 5: Optoelectronic devices
GB/T15651-1995半导体器件分立器件和集成电路第5部分:光电子器件
8.
Semiconductor devices--Discrete devices--Part 8: Field-effect transistors
GB/T4586-1994半导体器件分立器件第8部分:场效应晶体管
9.
Semiconductor devices Discrete devices and integrated circuits Part 1: General
GB/T17573-1998半导体器件分立器件和集成电路第1部分:总则
10.
Semiconductor devices--Discrete devices and integrated circuits--Part 2: Rectifier diodes
GB/T4023-1997半导体器件分立器件和集成电路第2部分:整流二极管
11.
Semiconductor devices--Discrete devices--Part 3: Signal(including switching)and regulator diodes
GB/T6571-1995半导体器件分立器件第3部分:信号(包括开关)和调整二极管
12.
Semiconductor devices-Generic specification for discrete devices and integrated circuits
GB/T4589.1-1989半导体器件分立器件和集成电路总规范(可供认证用)
13.
fuse for protection of semiconductor device
保护半导体器件熔断器
14.
Semiconductor devices--Part 6: Thyristors
GB/T15291-1994半导体器件第6部分晶闸管
15.
Technological Fundamentals of Semiconductor Device
半导体器件工艺原理
16.
metal-oxide-semiconductor device
金属－氧化物－半导体器件
17.
semiconductor device parameter stability
半导体器件参数稳定性
18.
Luminous Material and Device of Semiconductor ?
半导体发光材料与器件