1.
Research on Micro Displacement Stage in Optical Probe Topography Measurement System;
光探针形貌测量系统中微位移工作台的研究
2.
Analysis on Reconstruction of Stylus Probe for Micro and Nano Surface Measurement;
微纳米表面形貌测量中探针形状重建的分析
3.
The Technology of 3D Measurement Based on Multiple Spectral Bands and Spatial Light Modulation;
多谱段空间光调制三维形貌测量技术
4.
Research on Three-Dimension Profile Measurement Method Based on the Structure Light;
基于结构光的三维形貌测量方法研究
5.
3-D Shape Measurement Studies Based on Phase Measurement Methods;
基于相位测量法的光学三维形貌测量研究
6.
Optical Three-dimension Profilometry Measurement and Software Design and Development;
光学三维形貌测量及其软件雏形设计与实现
7.
Researches on Intense Laser Indused Damage of the Photoelectric Detectors and Changes in the Surface Topography
强激光与PIN探测器作用表面形貌及损伤研究
8.
Research development of fluorescent probe measurement of trace element zinc
用于微量锌离子检测的荧光探针技术
9.
Study on Rapid 3D Surface Measurement System Based on Laser Visual Inspection;
基于激光视觉的三维形貌快速测量研究
10.
Research on Measurement of 3D Surface Topography Based on Scanning White-light Interferometry;
白光扫描干涉三维表面形貌测量技术的研究
11.
Study on the Optimization of the Laser Scanning 3D Surface Measurement System
激光扫描三维形貌测量系统的优化研究
12.
Study on LabVIEW Based Measurement System of 3-D Profile Using Color Structured Light
基于LabVIEW的彩色结构光三维形貌测量系统的研究
13.
3D Surface Measurement System for Free-Form Surface Based on Closed-Light-Section Method
基于闭合光刀法的自由曲面三维形貌测量系统
14.
Reconstruction of the 3D Surface Profile of Micro Device Based on White-Light Interference Measurement Technology
基于白光干涉测量技术的微器件三维形貌重构
15.
Morphology Determination of Multi-Needle Bipolar Corona Discharge by OES
多针双极电晕放电形貌发射光谱研究
16.
Synchronous Fluorescence Determination of Rosmarinic Acid with Surface-modified CdTe Quantum Dots as a Fluorescence Probe
迷迭香酸的CdTe量子点荧光探针同步荧光法测定
17.
Measurement of surface topography of transmission phase grating based on phase measure method
基于相位测量法测量透射式相位光栅的表面形貌
18.
Measuring Method for Topography of DOE Based on Dual-Path Two-Wavelength Phase Shifting Interferometric Microscopy
双光路双波长相移干涉显微法测量衍射光学元件形貌